Number of the records: 1  

Photoelectron escape depth

    1.
    SYSNO ASEP0131838
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitlePhotoelectron escape depth
    Author(s) Zemek, Josef (FZU-D) RID, ORCID
    Hucek, Stanislav (FZU-D)
    Jablonski, A. (PL)
    Tilinin, I. S. (PL)
    Source TitleJournal of Electron Spectroscopy and Related Phenomena. - : Elsevier - ISSN 0368-2048
    Roč. 76, - (1995), s. 443-447
    Languageeng - English
    CountryNL - Netherlands
    R&D ProjectsGA202/95/0032 GA ČR - Czech Science Foundation (CSF)
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing1999

Number of the records: 1  

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