0131838 - FZU-D 980276 RIV NL eng J - Journal Article
Zemek, Josef - Hucek, Stanislav - Jablonski, A. - Tilinin, I. S.
Photoelectron escape depth.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 76, - (1995), s. 443-447. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA ČR GA202/95/0032
Impact factor: 1.376, year: 1995
Permanent Link: http://hdl.handle.net/11104/0029882