Number of the records: 1
An ellipsometric study of Ni, Mo and NixN films deposited on Si
- 1.0131678 - FZU-D 980173 RIV NL eng J - Článek v odborném periodiku
Tarasenko, A. A. - Jastrabík, Lubomír - Chvostová, Dagmar - Sobota, Jaroslav - Novák, J. (Redaktor, editor)
An ellipsometric study of Ni, Mo and NixN films deposited on Si.
Thin Solid Films. 313-314, - (1998), s. 314-318. ISSN 0040-6090. E-ISSN 1879-2731
Grant CEP: GA AV ČR IAA2010536
Impakt faktor: 1.019, rok: 1998
Trvalý link: http://hdl.handle.net/11104/0029733
Number of the records: 1