Svoboda, Pavel - Vašek, Petr - Boháček, J.
Temperature dependence of metrological characteristics of quantum Hall effect samples.
Conference Proceeding IMTC/98 "Where Instrumentation is Going?". Vol. 2. New York: IEEE, 1998, s. 1254-1256. ISBN 0-7803-4797-8.
[IEEE Instrumentation and Measurement Technology Conference 1998. St. Paul, Minnesota (US), 18.05.1998-21.05.1998]
R&D Projects: GA ČR GA102/98/1571
http://hdl.handle.net/11104/0029659