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Time-resolved reflectivity studies of phase transitioin in polycrystalline Si induced by excimer laser irradiation

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    0131257 - FZU-D 970371 RIV CH eng C - Conference Paper (international conference)
    Ulrych, Ivo - Chvoj, Zdeněk - Cháb, Vladimír - Černík, M. - Přikryl, Petr - Černý, R. - El Kader, K. M. A.
    Time-resolved reflectivity studies of phase transitioin in polycrystalline Si induced by excimer laser irradiation.
    3-908450-19-5. In: Polycrystalline Semiconductors. Zug: Trans. Tech. Publ., 1996 - (Pizzini, S.; Strunk, H.; Werner, J.), s. 173-181. Solid State Phenomena., V.
    [Polyse 95. Cargnano (IT), 09.09.1995-14.09.1995]
    R&D Projects: GA ČR GA202/94/1801; GA AV ČR IAA110433; GA MŠMT OK 148
    Permanent Link: http://hdl.handle.net/11104/0029334


     
     

Number of the records: 1  

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