The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM

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SYSNO	0109031
Title	The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM
Title	Sběrová účinnost Everhart-Thornley-ho detektoru sekundárních elektronů v REM
Author(s)	Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	EMC 2004 - Proceedings of the 13th European Microscopy Congress, 1 - Instrumentation & Methodology.. s. 79-80. - Liege : Belgian Society for Microscopy, 2004
Conference	EMC 2004 /13./ European Microscopy Congress, Antwerp, 22.08.2004-27.08.2004
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	IAA1065304 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
Language	eng
Country	BE
Keywords	scanning electron microscopy * collection efficiency * secondary electrons
Permanent Link	http://hdl.handle.net/11104/0016143

Number of the records: 1