Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM.
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 79-80.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR IAA1065304
http://hdl.handle.net/11104/0016143