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The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM
- 1.KONVALINA, Ivo, MÜLLEROVÁ, Ilona, FRANK, Luděk. The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM. In: EMC 2004 - Proceedings of the 13th European Microscopy Congress. Instrumentation & Methodology. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 79-80.
Number of the records: 1