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Some properties of very thin Bi.sub.2./sub.Te.sub.3./sub. layers prepared by laser ablation
- 1.0105870 - URE-Y 20040035 RIV DE eng C - Conference Paper (international conference)
Zeipl, Radek - Pavelka, Martin - Jelínek, Miroslav - Chval, Jindřich - Lošťák, P. - Žďánský, Karel - Vaniš, Jan - Karamazov, S. - Vacková, S. - Walachová, Jarmila
Some properties of very thin Bi2Te3 layers prepared by laser ablation.
[Některé vlastnosti velmi tenkých Bi2Te3 vrstev připravených laserovou ablací.]
Proceedings 6th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Technologies - EXMATEC'2002. Weinheim: WileyVCH Verlag, 2003 - (Stutzmann, M.), s. 867-871. Physica Status Solidi, Conferences, 0.3.2003. ISBN 3-527-40436-8.
[EXMATEC 2002 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /6./. Budapest (HU), 26.05.2002-29.05.2002]
R&D Projects: GA ČR GA202/02/0098
Institutional research plan: CEZ:AV0Z2067918
Keywords : field emission electron microscopy * thermoelectric devices
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0013058
Number of the records: 1