Zemek, Josef - Jiříček, Petr - Lesiak, B. - Jablonski, A.
Elastic electron backscattering from silicon surfaces: effect of charge-carrier concentration.
Surface and Interface Analysis. Roč. 36, - (2004), s. 809-811. ISSN 0142-2421. E-ISSN 1096-9918
R&D Projects: GA ČR GA202/02/0237
Impact factor: 1.209, year: 2004
http://hdl.handle.net/11104/0011506