Number of the records: 1
Polycrystalline Wafers of Silicalite-1 etched by HF Acid and Viewed by SEM
- 1.Brabec, Libor - Kočiřík, Milan
Polycrystalline Wafers of Silicalite-1 etched by HF Acid and Viewed by SEM.
Applied Surface Science. Roč. 228, č. 1 (2004), s. 1-4. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GA104/01/0945; GA AV ČR IAA1040101
Impact factor: 1.497, year: 2004
http://hdl.handle.net/11104/0000025
Number of the records: 1