Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection

Number of the records: 1

1.

SYSNO	0100521
Title	Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
Title	Tenké vrstvy mikrokrystalického křemíku studované mikroskopií atomových sil s detekcí elektrických proudů
Author(s)	Rezek, Bohuslav (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Journal of Applied Physics. Roč. 92, č. 1 (2002), s. 587-593. - : AIP Publishing
Document Type	Článek v odborném periodiku
Grant	IAA1010809 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	IAB2949101 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	GA202/98/0669 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	US
Keywords	amorphous silicon * microcrystalline silicon
Permanent Link	http://hdl.handle.net/11104/0008021

Number of the records: 1