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Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
- 1.Rezek, Bohuslav - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection.
Journal of Applied Physics. Roč. 92, č. 1 (2002), s. 587-593. ISSN 0021-8979. E-ISSN 1089-7550
R&D Projects: GA AV ČR IAA1010809; GA AV ČR IAB2949101; GA ČR GA202/98/0669
Impact factor: 2.281, year: 2002
http://hdl.handle.net/11104/0008021
Number of the records: 1