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Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
- 1.Rezek, B., Stuchlík, J., Fejfar, A., Kočka, J. Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection. Journal of Applied Physics. 2002, 92(1), 587-593. ISSN 0021-8979. E-ISSN 1089-7550.
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