Number of the records: 1
Height profile measurement by means of white light interferometry
- 1.
SYSNO 0100119 Title Height profile measurement by means of white light interferometry Title Měření výškového profilu pomocí interferometrie v bílém světle Author(s) Pavlíček, Pavel (FZU-D) RID, ORCID, SAI Source Title Wave and Qantum Aspects of Contemporary Optics. s. 139-144. - Washington : SPIE The International Society for Optical Engineering, 2003 / Zajac M. ; Masajada J. Conference Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics /13./, Krzyzowa, 09.09.2002-13.09.2002 Document Type Konferenční příspěvek (zahraniční konf.) Grant LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z1010921 - FZU-D Language eng Country US Keywords white-light interferometry * height profile * rough surface * speckle pattern Permanent Link http://hdl.handle.net/11104/0007625
Number of the records: 1