Number of the records: 1
Height profile measurement by means of white light interferometry
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$a eng 102 $a US 200 1-
$a Height profile measurement by means of white light interferometry 215 $a 6 s. 463 -1
$1 010 $a 0-8194-5146-0 $1 011 $a 0277-786X $1 200 1 $a Wave and Qantum Aspects of Contemporary Optics $v s. 139-144 $1 210 $a Washington $c SPIE The International Society for Optical Engineering $d 2003 $1 225 1 $a SPIE - The International Society for Optical Engineering. $v 5259 $1 702 $a Zajac $b M. $4 340 $1 702 $a Masajada $b J. $4 340 541 $a Měření výškového profilu pomocí interferometrie v bílém světle $z cze 610 1-
$a white-light interferometry 610 1-
$a height profile 610 1-
$a rough surface 610 1-
$a speckle pattern 700 -1
$a Pavlíček $b Pavel $p FZU-D $w Classical and Quantum Optics $4 070 $3 cav_un_auth*0100441 $T Fyzikální ústav AV ČR, v. v. i.
Number of the records: 1