Horváth, Pavel - Šmíd, Petr - Hrabovský, Miroslav
Analysis of stress measurement by means of a speckle decorrelation.
Surface Scattering and Diffraction III. Washington: SPIE The International Society for Optical Engineering, 2003 - (Gu, Z.; Maradudin, A.), s. 174-181. Proceedings of SPIE, 5189. ISBN 0-8194-5062-6. ISSN 0277-786X.
[International Conference on Surface Scattering and Diffraction III. San Diego, California (US), 03.08.2003-08.08.2003]
R&D Projects: GA MŠMT LN00A015
http://hdl.handle.net/11104/0007561