Number of the records: 1
Enhancement of SEM to scanning LEEM
- 1.0088945 - ÚPT 2008 RIV NL eng J - Journal Article
Müllerová, Ilona - Matsuda, K. - Hrnčiřík, Petr - Frank, Luděk
Enhancement of SEM to scanning LEEM.
[Rozšíření SEM na rastrovací LEEM.]
Surface Science. Roč. 601, č. 20 (2007), s. 4768-4773. ISSN 0039-6028. E-ISSN 1879-2758
R&D Projects: GA ČR GA102/05/2327; GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * LEEM * scanning LEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.855, year: 2007
Permanent Link: http://hdl.handle.net/11104/0150316
Number of the records: 1