SYSNO ASEP | 0081154
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Document Type | J - Journal Article
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R&D Document Type | The record was not marked in the RIV
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Subsidiary J | Ostatní články
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Title | Laser tests of silicon detectors
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Title | Testy křemíkových detektorů laserovým zářením
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Author(s) | Doležal, Z. (CZ) Escobar, C. (ES) Gadomski, S. (PL) Garcia, C. (ES) Gonzales, S. (ES) Kodyš, Peter (URE-Y) Kubík, P. (CZ) Lacasta, C. (ES) Marti, S. (ES) Mitsou, V. A. (ES) Moorhead, G. F. (AU) Phillips, P. W. (GB) Řezníček, P. (CZ) Slavík, Radan (URE-Y)
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Source Title | Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier
- ISSN 0168-9002
Roč. 573, 1/2 (2007), s. 12-15
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Number of pages | 4 s.
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Action | International Conference on Position-Sensitive Detectors - PSD /7./
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Event date | 12.09.2005-16.09.2005
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VEvent location | Liverpool
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Country | GB - United Kingdom
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Event type | WRD
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Language | eng - English
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Country | NL - Netherlands
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Keywords | semiconductor devices
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Subject RIV | BH - Optics, Masers, Lasers
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R&D Projects | KJB200670601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
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CEZ | AV0Z20670512 - URE-Y (2005-2011)
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Annotation | This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers.
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Workplace | Institute of Radio Engineering and Electronics
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Contact | Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488
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Year of Publishing | 2007
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