Number of the records: 1  

Laser tests of silicon detectors

  1. 1.
    SYSNO ASEP0081154
    Document TypeJ - Journal Article
    R&D Document TypeThe record was not marked in the RIV
    Subsidiary JOstatní články
    TitleLaser tests of silicon detectors
    TitleTesty křemíkových detektorů laserovým zářením
    Author(s) Doležal, Z. (CZ)
    Escobar, C. (ES)
    Gadomski, S. (PL)
    Garcia, C. (ES)
    Gonzales, S. (ES)
    Kodyš, Peter (URE-Y)
    Kubík, P. (CZ)
    Lacasta, C. (ES)
    Marti, S. (ES)
    Mitsou, V. A. (ES)
    Moorhead, G. F. (AU)
    Phillips, P. W. (GB)
    Řezníček, P. (CZ)
    Slavík, Radan (URE-Y)
    Source TitleNuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
    Roč. 573, 1/2 (2007), s. 12-15
    Number of pages4 s.
    ActionInternational Conference on Position-Sensitive Detectors - PSD /7./
    Event date12.09.2005-16.09.2005
    VEvent locationLiverpool
    CountryGB - United Kingdom
    Event typeWRD
    Languageeng - English
    CountryNL - Netherlands
    Keywordssemiconductor devices
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsKJB200670601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z20670512 - URE-Y (2005-2011)
    AnnotationThis paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers.
    WorkplaceInstitute of Radio Engineering and Electronics
    ContactPetr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488
    Year of Publishing2007
Number of the records: 1  

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