Number of the records: 1
The injected-charse contrast mechanism in scanned imaging of doped semiconductors by very slow electrons
- 1.Frank, Luděk - Müllerová, Ilona
The injected-charse contrast mechanism in scanned imaging of doped semiconductors by very slow electrons.
Ultramicroscopy. Roč. 106, č. 1 (2005), s. 28-36. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA ČR(CZ) GA202/04/0281
Impact factor: 2.490, year: 2005
DOI: https://doi.org/10.1016/j.ultramic.2005.06.004
http://hdl.handle.net/11104/0111513
Number of the records: 1