Frank, L., Müllerová, I. The injected-charse contrast mechanism in scanned imaging of doped semiconductors by very slow electrons. Ultramicroscopy. 2005, 106(1), 28-36. ISSN 0304-3991. E-ISSN 1879-2723. Available: https://doi.org/10.1016/j.ultramic.2005.06.004