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Effect of atomic‐temperature dependence of the electron–phonon coupling in two‐temperature model

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    SYSNO ASEP0560473
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleEffect of atomic‐temperature dependence of the electron–phonon coupling in two‐temperature model
    Author(s) Akhmetov, F. (NL)
    Medvedev, Nikita (FZU-D) ORCID, RID
    Makhotkin, I. (NL)
    Ackermann, M. (NL)
    Milov, I. (NL)
    Number of authors5
    Article number5193
    Source TitleMaterials. - : MDPI
    Roč. 15, č. 15 (2022)
    Number of pages12 s.
    Languageeng - English
    CountryCH - Switzerland
    Keywordselectron–phonon coupling ; two‐temperature model ; ultrafast laser irradiation of metals
    Subject RIVBH - Optics, Masers, Lasers
    OECD categoryFluids and plasma physics (including surface physics)
    R&D ProjectsLTT17015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2018114 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Research Infrastructuree-INFRA CZ - 90140 - CESNET, zájmové sdružení právnických osob
    Method of publishingOpen access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000838977300001
    EID SCOPUS85137147652
    DOI10.3390/ma15155193
    AnnotationUltrafast laser irradiation of metals can often be described theoretically with the two‐temperature model. The energy exchange between the excited electronic system and the atomic one is governed by the electron–phonon coupling parameter. The electron–phonon coupling depends on both, the electronic and the atomic temperature. We analyze the effect of the dependence of the electron–phonon coupling parameter on the atomic temperature in ruthenium, gold, and palladium. It is shown that the dependence on the atomic temperature induces nonlinear behavior, in which a higher initial electronic temperature leads to faster electron–phonon equilibration. Analysis of the experimental measurements of the transient thermoreflectance of the laser‐irradiated ruthenium thin film allows us to draw some, albeit indirect, conclusions about the limits of the applicability of the different coupling parametrizations.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2023
    Electronic addresshttps://hdl.handle.net/11104/0333397
Number of the records: 1  

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