Using spatial light modulator for correction of wavefront reflected from optically rough surface

0499804 - ÚPT 2019 RIV US eng C - Conference Paper (international conference)
Šarbort, Martin - Řeřucha, Šimon - Fořt, Tomáš - Pikálek, Tomáš - Holá, Miroslava - Oulehla, Jindřich - Lazar, Josef
Using spatial light modulator for correction of wavefront reflected from optically rough surface.
The International Society for Optical Engineering (Proceedigs of SPIE 10834). Bellingham: SPIE, 2018, č. článku 108341D. ISBN 978-151062297-5. ISSN 0277-786X.
[International Conference on Speckle Metrology /7./. Janow Podlaski (PL), 10.09.2018-12.09.2018]
R&D Projects: GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : rough surface * speckle * spatial light modulator * wavefront correction
OECD category: Optics (including laser optics and quantum optics)

We present an experimental study of the method using a spatial light modulator for correction of the wavefront reflected from the optically rough surface. This method is based on the detection of the mutual phase differences between different regions of the wavefront that correspond to the constructive interference. We study the capabilities of this method from the metrological point of view for the ground glass samples characterized by several different levels of roughness. The resulting wavefront correction is tested in dependence on the measurement parameters settings and is verified by analyzing two specific patterns generated by the spatial light modulator.
Permanent Link: http://hdl.handle.net/11104/0291990