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What’s next in Scanning Low Energy Electron Microscopy?
- 1.0481148 - ÚPT 2018 AT eng A - Abstract
Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Frank, Luděk
What’s next in Scanning Low Energy Electron Microscopy?
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 22.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
R&D Projects: GA TA ČR(CZ) TE01020118
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : SLEEM * primary beam energy * signal electrons
OECD category: Nano-materials (production and properties)
The optimum contrast can be found in the SLEEM for each specimen, when proper primary beam energy and the collection of the signal electrons by the detector align.
Permanent Link: http://hdl.handle.net/11104/0276751
Number of the records: 1