Number of the records: 1  

Optical diagnostics of ns-pulsed discharge generated in liquid phase

  1. 1.
    SYSNO ASEP0469552
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleOptical diagnostics of ns-pulsed discharge generated in liquid phase
    Author(s) Pongrác, Branislav (UFP-V)
    Šimek, Milan (UFP-V) RID, ORCID
    Babický, Václav (UFP-V) RID
    Člupek, Martin (UFP-V) RID
    Lukeš, Petr (UFP-V) RID, ORCID
    Source TitleProceedings of the 23rd Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases, 05.Plasma diagnostics. - Bratislava : European Physical Society as a Europhysics conference, 2016 / Medvecká V. ; Papp P. ; Országh J. ; Matejčík Š. - ISBN 979-10-96389-02-5
    Pagess. 319-320
    Number of pages2 s.
    Publication formPrint - P
    ActionEurophysics Conference on the Atomic and Molecular Physics of Ionized Gases (ESCAMPIG XXIII)/23./
    Event date12.07.2016 - 16.07.2016
    VEvent locationBratislava
    CountrySK - Slovakia
    Event typeWRD
    Languageeng - English
    CountrySK - Slovakia
    Keywordsoptical diagnostics
    Subject RIVBL - Plasma and Gas Discharge Physics
    R&D ProjectsGA15-12987S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUFP-V - RVO:61389021
    AnnotationElectrical discharge generated by nanosecond high voltage (~80 kV amplitude, ~5 ns duration, 1–10 Hz repetition rate) pulses in liquid phase have been studied experimentally. We used optical diagnostics as the main method for discharge investigation. Temporally resolved optical emission spectroscopy showed interesting properties of a ns discharge which is demonstrated by different emission spectra profile compared with the discharges produced by HV pulses of μs duration. However, some known peaks typical for water discharges (Hα, OI) were clearly identified.
    WorkplaceInstitute of Plasma Physics
    ContactVladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975
    Year of Publishing2017
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.