Number of the records: 1  

Very low energy STEM/TOF system

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    SYSNO ASEP0460199
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleVery low energy STEM/TOF system
    Author(s) Daniel, Benjamin (UPT-D) RID
    Radlička, Tomáš (UPT-D) RID, ORCID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors5
    Source TitleProceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. - Brno : Institute of Scientific Instruments CAS, 2016 / Mika Filip - ISBN 978-80-87441-17-6
    Pagess. 6-7
    Number of pages2 s.
    Publication formPrint - P
    ActionInternational Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./
    Event date29.05.2016 - 03.06.2016
    VEvent locationSkalský dvůr
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordselecvtron microscopy ; SLEEM ; UHV SLEEM
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    Institutional supportUPT-D - RVO:68081731
    UT WOS000391254000001
    AnnotationScanning low energy electron microscopes (SLEEMs) have been built at ISI for over 20 years, either by modification of commercially available SEMs with a cathode lens or completely self-built in case of a dedicated ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). Recently, the range of detection methods has been extended
    by a detector for electrons transmitted through ultrathin films and 2D crystals like graphene. For a better understanding of interaction between low energy electrons and solids in general, and the image contrast mechanism in particular, it was considered useful to measure the energy of transmitted electrons. This allows a better comparison with simulations, which suffer from increasing complexity due to a stronger interaction of electrons with the density of states at low energies.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2017
    Electronic addresshttp://www.trends.isibrno.cz/
Number of the records: 1  

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