Measurements of the Secondary and Backscattered Electron Coefficients in the Very Low Energy Range
1.
SYSNO ASEP
0204988
Document Type
C - Proceedings Paper (int. conf.)
R&D Document Type
Conference Paper
Title
Measurements of the Secondary and Backscattered Electron Coefficients in the Very Low Energy Range
Author(s)
Zadražil, Martin (UPT-D) El Gomati, M. M. (GB)
Source Title
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar / Müllerová I. ; Frank L.. - Brno : Czechoslovak Society for Electron Microscopy, 1998
- ISBN 80-238-2333-7
Pages
s. 82
Number of pages
1 s.
Action
Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation
Event date
29.06.1998-03.07.1998
VEvent location
Skalský Dvůr
Country
CZ - Czech Republic
Language
eng - English
Country
CZ - Czech Republic
Subject RIV
JA - Electronics ; Optoelectronics, Electrical Engineering
Workplace
Institute of Scientific Instruments
Contact
Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing
1999
Number of the records: 1
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