Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies

Konvalina, Ivo; Daniel, Benjamin; Zouhar, Martin; Paták, Aleš; Piňos, Jakub; Průcha, Lukáš; Frank, Luděk; Müllerová, Ilona; Materna Mikmeková, Eliška

Number of the records: 1

Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies

1.

SYSNO ASEP	0552272
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies
Author(s)	Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Daniel, Benjamin (UPT-D)_RID Zouhar, Martin (UPT-D)_{ORCID, RID, SAI} Paták, Aleš (UPT-D)_{RID, ORCID, SAI} Piňos, Jakub (UPT-D)_{RID, ORCID, SAI} Průcha, Lukáš (UPT-D)_ORCID Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Materna Mikmeková, Eliška (UPT-D)_{ORCID, RID, SAI}
Source Title	15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. - Institute of Scientific Instruments of the CAS : Brno, 2021 S. 84
Number of pages	1 s.
Publication form	Online - E
Action	International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./
Event date	18.10.2021 - 19.10.2021
VEvent location	online
Country	CZ - Czech Republic
Event type	WRD
Language	eng - English
Country	CZ - Czech Republic
Keywords	time‑of‑flight spectrometer ; graphene ; inelastic mean free path ; energy‑loss spectrum ; density‑functional theory
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Electrical and electronic engineering
Institutional support	UPT-D - RVO:68081731
Annotation	New technological procedures and innovations in the development of advanced 2D materials place high demands on the techniques for their analysis. A detailed study of the interaction of electrons with matter is essential in the design of next generation materials. Inelastic mean free path is a key parameter of electron scattering of electrons both in bulk materials and in thin foils. We performed pilot experiments for monolayer graphene to acquire electron energy‑loss spectra for low landing energies.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2022

Number of the records: 1