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Electron emission from H-terminated diamond enhanced by polypyrrole grafting

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    SYSNO ASEP0541754
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleElectron emission from H-terminated diamond enhanced by polypyrrole grafting
    Author(s) Ukraintsev, Egor (FZU-D) RID, ORCID
    Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Janssen, W. (BE)
    Haenen, K. (BE)
    Takeuchi, D. (JP)
    Bábor, P. (CZ)
    Rezek, B. (CZ)
    Number of authors7
    Source TitleCarbon. - : Elsevier - ISSN 0008-6223
    Roč. 176, May (2021), s. 642-649
    Number of pages8 s.
    Languageeng - English
    CountryUS - United States
    Keywordsdiamond ; surfaces ; electron emission ; electron affinity ; polypyrrole ; Kelvin probe
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryNano-materials (production and properties)
    R&D ProjectsEF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Method of publishingLimited access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000630376700063
    EID SCOPUS85101296826
    DOI10.1016/j.carbon.2020.12.043
    AnnotationElectron emission plays an important role in diverse applications, from cold cathodes to chemical processes (solvated electrons, water purification), energy generation (thermionic or dye-sensitized solar cells), and even cancer treatment. Here we show that by surface treatment using electrochemically grown polypyrrole the secondary-electron emission and photoelectron emission from boron-doped diamond is enhanced even above the intensity of electron emission from the hydrogen-terminated surface with negative electron affinity. This enhancement is stable in air for at least one month and it persists also in vacuum after thermal annealing. Scanning electron microscopy, Kelvin probe force microscopy, total photoelectron yield spectroscopy as well as surface mapping by Auger and secondary ion mass spectroscopies are used to characterize and correlate the surface electronic and chemical properties. A model of the electron emission enhancement is provided.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2022
    Electronic addresshttps://doi.org/10.1016/j.carbon.2020.12.043
Number of the records: 1  

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