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Electron emission from H-terminated diamond enhanced by polypyrrole grafting
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SYSNO ASEP 0541754 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Electron emission from H-terminated diamond enhanced by polypyrrole grafting Author(s) Ukraintsev, Egor (FZU-D) RID, ORCID
Kromka, Alexander (FZU-D) RID, ORCID, SAI
Janssen, W. (BE)
Haenen, K. (BE)
Takeuchi, D. (JP)
Bábor, P. (CZ)
Rezek, B. (CZ)Number of authors 7 Source Title Carbon. - : Elsevier - ISSN 0008-6223
Roč. 176, May (2021), s. 642-649Number of pages 8 s. Language eng - English Country US - United States Keywords diamond ; surfaces ; electron emission ; electron affinity ; polypyrrole ; Kelvin probe Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Nano-materials (production and properties) R&D Projects EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Limited access Institutional support FZU-D - RVO:68378271 UT WOS 000630376700063 EID SCOPUS 85101296826 DOI 10.1016/j.carbon.2020.12.043 Annotation Electron emission plays an important role in diverse applications, from cold cathodes to chemical processes (solvated electrons, water purification), energy generation (thermionic or dye-sensitized solar cells), and even cancer treatment. Here we show that by surface treatment using electrochemically grown polypyrrole the secondary-electron emission and photoelectron emission from boron-doped diamond is enhanced even above the intensity of electron emission from the hydrogen-terminated surface with negative electron affinity. This enhancement is stable in air for at least one month and it persists also in vacuum after thermal annealing. Scanning electron microscopy, Kelvin probe force microscopy, total photoelectron yield spectroscopy as well as surface mapping by Auger and secondary ion mass spectroscopies are used to characterize and correlate the surface electronic and chemical properties. A model of the electron emission enhancement is provided. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2022 Electronic address https://doi.org/10.1016/j.carbon.2020.12.043
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