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Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF
- 1.Konvalina, I., Daniel, B., Zouhar, M., Paták, A., Piňos, J., Radlička, T., Frank, L., Müllerová, I., Materna Mikmeková, E. Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF. In: Microscopy 2020. Praha: Československá mikroskopická společnost, 2020, s. 95-96.
Number of the records: 1