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Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF
- 1.KONVALINA, Ivo, DANIEL, Benjamin, ZOUHAR, Martin, PATÁK, Aleš, PIŇOS, Jakub, RADLIČKA, Tomáš, FRANK, Luděk, MÜLLEROVÁ, Ilona, MATERNA MIKMEKOVÁ, Eliška. Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF. In: Microscopy 2020. Praha: Československá mikroskopická společnost, 2020, s. 95-96.
Number of the records: 1