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Electrical and optical characteristics of boron doped nanocrystalline diamond films

  1. 1.
    SYSNO ASEP0511026
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleElectrical and optical characteristics of boron doped nanocrystalline diamond films
    Author(s) Stuchlíková, The-Ha (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Mortet, Vincent (FZU-D) RID, ORCID
    Taylor, Andrew (FZU-D) RID, ORCID
    Ashcheulov, Petr (FZU-D) ORCID, RID
    Stuchlík, Jiří (FZU-D) RID, ORCID
    Volodin, V.A. (RU)
    Number of authors7
    Article number108813
    Source TitleVacuum. - : Elsevier - ISSN 0042-207X
    Roč. 168, Oct (2019), s. 1-4
    Number of pages4 s.
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsRaman spectroscopy ; boron doped diamond ; photothermal deflection spectroscopy
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsEF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA17-05259S GA ČR - Czech Science Foundation (CSF)
    Fellowship J. E. Purkyně GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    Method of publishingLimited access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000490044200006
    EID SCOPUS85069544376
    DOI10.1016/j.vacuum.2019.108813
    AnnotationBoron doped diamond is a prospective material which can be used as a conductive and optically transparent thin-film electrode in a variety of optoelectronic applications. In this work, we present the results of the temperature resolved electrical conductivity, optical reflection, transmission and absorption of thin boron doped nanocrystalline diamond films grown by a microwave plasma enhanced chemical vapor deposition. Optical transmittance, reflectance and absorptance properties of layers were studied by a photo-thermal deflection spectroscopy analysis. Raman spectroscopy with various excitation wavelengths was employed for the analysis of nanocrystalline diamond layers. The measured position, shift and broadening of the characteristic boron doped diamond Raman lines were used for the determination of the boron concentration. Correlation between the results of the atomic boron concentration estimated via the Raman analysis and measured electrical conductivity values is presented.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2020
    Electronic addresshttps://doi.org/10.1016/j.vacuum.2019.108813
Number of the records: 1  

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