Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?

Number of the records: 1

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SYSNO	0494374
Title	Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Author(s)	Rodenburg, C. (GB) Masters, R. (GB) Abrams, K. (GB) Dapor, M. (IT) Krátký, Stanislav (UPT-D)_{RID, ORCID, SAI} Mika, Filip (UPT-D)_{RID, SAI, ORCID}
Corespondence/senior	Rodenburg, C. - Korespondující autor
Source Title	Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. S. 68-69. - Brno : Institute of Scientific Instruments The Czech Academy of Sciences, 2018
Conference	Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, 04.06.2018 - 08.06.2018, Skalský dvůr
Document Type	Konferenční příspěvek (zahraniční konf.)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CZ
Keywords	secondary electrons * polymers * hyperspectral imaging
Permanent Link	http://hdl.handle.net/11104/0288492

Number of the records: 1