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Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
- 1.Rodenburg, C., Masters, R., Abrams, K., Dapor, M., Krátký, S., Mika, F. Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts? In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.
Number of the records: 1