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Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
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SYSNO 0444439 Title Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy Author(s) Lazar, Josef (UPT-D) RID, ORCID, SAI
Klapetek, P. (CZ)
Valtr, M. (CZ)
Hrabina, Jan (UPT-D) RID, ORCID, SAI
Buchta, Zdeněk (UPT-D) RID, SAI, ORCID
Číp, Ondřej (UPT-D) RID, SAI, ORCID
Čížek, Martin (UPT-D) RID, ORCID, SAI
Oulehla, Jindřich (UPT-D) RID, ORCID, SAI
Šerý, Mojmír (UPT-D) RID, SAISource Title Sensors. Roč. 14, č. 1 (2014), s. 877-886. - : MDPI Document Type Článek v odborném periodiku Grant GPP102/11/P820 GA ČR - Czech Science Foundation (CSF) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EE2.4.31.0016 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) TA02010711 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 Language eng Country CH Keywords nanometrology * nanopositioning interferometry * AFM * nanoscale Permanent Link http://hdl.handle.net/11104/0246959
Number of the records: 1