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Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
- 1.Lazar, J., Klapetek, P., Valtr, M., Hrabina, J., Buchta, Z., Číp, O., Čížek, M., Oulehla, J., Šerý, M. Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors. 2014, 14(1), 877-886. E-ISSN 1424-8220. Available: doi: 10.3390/s140100877
Number of the records: 1