Number of the records: 1
Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
- 1.LAZAR, J., KLAPETEK, P., VALTR, M., HRABINA, J., BUCHTA, Z., ČÍP, O., ČÍŽEK, M., OULEHLA, J., ŠERÝ, M. Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors. 2014, 14(1), 877-886. E-ISSN 1424-8220. Available: doi: 10.3390/s140100877
Number of the records: 1