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Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
- 1.LAZAR, Josef, KLAPETEK, P., VALTR, M., HRABINA, Jan, BUCHTA, Zdeněk, ČÍP, Ondřej, ČÍŽEK, Martin, OULEHLA, Jindřich, ŠERÝ, Mojmír. Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors. 2014, 14(1), 877-886. E-ISSN 1424-8220. Available: doi: 10.3390/s140100877
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