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Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition
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SYSNO ASEP 0378662 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition Author(s) Novotný, Michal (FZU-D) RID, ORCID, SAI
Čížek, J. (CZ)
Kužel, R. (CZ)
Bulíř, Jiří (FZU-D) RID, ORCID, SAI
Lančok, Ján (FZU-D) RID, ORCID
Connolly, J. (IE)
McCarthy, E. (IE)
Krishnamurthy, S. (IE)
Mosnier, J.-P. (IE)
Anwand, W. (DE)
Brauer, G. (DE)Source Title Journal of Physics D-Applied Physics. - : Institute of Physics Publishing - ISSN 0022-3727
Roč. 45, č. 22 (2012), 1-12Number of pages 12 s. Language eng - English Country GB - United Kingdom Keywords ZnO thin film ; pulsed laser deposition ; x-ray diffraction positron implantation spectroscopy Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GAP108/11/0958 GA ČR - Czech Science Foundation (CSF) GP202/09/P324 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000305175100003 DOI 10.1088/0022-3727/45/22/225101 Annotation ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopy and defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ... Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2013
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