Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy

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SYSNO	0375356
Title	Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy
Author(s)	Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Itoh, T. (JP) Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Rezek, Bohuslav (FZU-D)_{RID, ORCID} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	ICANS 24. Program and Abstracts Book. S. 309. - Nara, 2011
Conference	International Conference on Amorphous and Nanocrystalline Semiconductors /24./ (ICANS 24), 21.08.2011-26.08.2011, Nara
Document Type	Abstrakt
Grant	LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	240826, XE - EU countries
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Language	eng
Country	JP
Keywords	carbon nanowalls * conductive atomic force microscopy * torsion resonance mode * nanostructures
Permanent Link	http://hdl.handle.net/11104/0208031

Number of the records: 1