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Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy
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SYSNO ASEP 0375356 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy Author(s) Vetushka, Aliaksi (FZU-D) RID, ORCID
Itoh, T. (JP)
Fejfar, Antonín (FZU-D) RID, ORCID, SAI
Ledinský, Martin (FZU-D) RID, ORCID, SAI
Rezek, Bohuslav (FZU-D) RID, ORCID
Kočka, Jan (FZU-D) RID, ORCID, SAISource Title ICANS 24. Program and Abstracts Book. - Nara, 2011
S. 309Number of pages 1 s. Action International Conference on Amorphous and Nanocrystalline Semiconductors /24./ (ICANS 24) Event date 21.08.2011-26.08.2011 VEvent location Nara Country JP - Japan Event type WRD Language eng - English Country JP - Japan Keywords carbon nanowalls ; conductive atomic force microscopy ; torsion resonance mode ; nanostructures Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100521 - FZU-D (2005-2011) Annotation We report results of Torsional Resonance Tunneling AFM (TR-TUNA) for local conductivity measurement of: carbon nanowalls, ZnO nanorods, Si nanowires. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
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