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Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy
- 1.Vetushka, Aliaksi - Itoh, T. - Fejfar, Antonín - Ledinský, Martin - Rezek, Bohuslav - Kočka, Jan
Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy.
ICANS 24. Program and Abstracts Book. Nara, 2011. s. 309.
[International Conference on Amorphous and Nanocrystalline Semiconductors /24./ (ICANS 24). 21.08.2011-26.08.2011, Nara]
http://hdl.handle.net/11104/0208031
Number of the records: 1