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Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy
- 1.Vetushka, A., Itoh, T., Fejfar, A., Ledinský, M., Rezek, B., Kočka, J. Nanoscale conductance study of delicate nanostructures by Torsional Resonance Tunneling Atomic Force Microscopy. In: ICANS 24. Program and Abstracts Book. Nara, 2011, s. 309.
Number of the records: 1