Number of the records: 1
Microscopic characterizations of nanostructured silicon thin films for solar cells
- 1.
SYSNO ASEP 0375054 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Microscopic characterizations of nanostructured silicon thin films for solar cells Author(s) Fejfar, Antonín (FZU-D) RID, ORCID, SAI
Klapetek, P. (CZ)
Zlámal, J. (CZ)
Vetushka, Aliaksi (FZU-D) RID, ORCID
Ledinský, Martin (FZU-D) RID, ORCID, SAI
Kočka, Jan (FZU-D) RID, ORCID, SAISource Title Amorphous and Polycrystalline Thin-Film Silicon Science and Technology. - Warrendale : MRS, 2011 / Yan B. ; Higashi S. ; Tsai C.C. ; Wang Q. ; Gleskova H. - ISBN 9781605112985 Pages s. 313-321 Number of pages 9 s. Action Materials Research Society Spring Meeting Event date 25.04.2011-29.04.2011 VEvent location San Francisko Country US - United States Event type WRD Language eng - English Country US - United States Keywords silicon ; scanning probe methods ; solar cells Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100521 - FZU-D (2005-2011) DOI 10.1557/opl.2011.1097 Annotation Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
Number of the records: 1