- Electric spike emergence and synchronization during wet etching of ov…
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Electric spike emergence and synchronization during wet etching of overlapping low energy light ion microbeam-irradiated polymers

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    SYSNO ASEP0585806
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleElectric spike emergence and synchronization during wet etching of overlapping low energy light ion microbeam-irradiated polymers
    Author(s) Vacík, Jiří (UJF-V) RID, ORCID, SAI
    Fink, Dietmar (UJF-V) ORCID, SAI
    Ceccio, Giovanni (UJF-V) ORCID, RID, SAI
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Cannavo, A. (US)
    Kiv, A. (IL)
    Number of authors6
    Source TitleRadiation Effects and Defects in Solids. - : Taylor & Francis - ISSN 1042-0150
    Roč. 179, 1-2 (2024), s. 175-198
    Number of pages24 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsPolyethylene terephthalate ; light ion irradiation ; wet etching ; electric spikes ; synchronization
    OECD categoryAtomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    R&D ProjectsGA22-17346S GA ČR - Czech Science Foundation (CSF)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS001207736500019
    EID SCOPUS85191191371
    DOI https://doi.org/10.1080/10420150.2024.2318728
    AnnotationElectric spike emission was observed for the first time for thin polymer foils irradiated with low energy light ion microbeams at overlapping fluences, when placing them in between two vessels filled with etchant and distilled water, respectively, and applying a low sinusoidal transverse voltage. The various shapes of recorded spike types are described and examined. From their emergence that occurs after different derived etching times, and the inter-correlation of different spike parameters, we draw the first conclusions about their formation mechanism, behavior, and usefulness for technical applications.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2025
    Electronic addresshttps://doi.org/10.1080/10420150.2024.2318728
Number of the records: 1  

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