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Effective IMFP of thin samples via the time-of-flight method
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SYSNO ASEP 0567527 Document Type A - Abstract R&D Document Type The record was not marked in the RIV Title Effective IMFP of thin samples via the time-of-flight method Author(s) Zouhar, Martin (UPT-D) ORCID, RID, SAI
Daniel, Benjamin (UPT-D) RID
Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Paták, Aleš (UPT-D) RID, ORCID, SAI
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAISource Title 16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. - Brno : Czechoslovak Microscopy Society, 2022 / Krzyžánek V. ; Hrubanová K. ; Hozák P. ; Müllerová I. ; Šlouf M. - ISBN 978-80-11-02253-2
S. 168Number of pages 1 s. Publication form Online - E Action Multinational Congress on Microscopy /16./ Event date 04.09.2022 - 09.09.2022 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords time‑of‑flight spectrometer ; SLEEM ; inelastic mean free path Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Electrical and electronic engineering R&D Projects GA22-34286S GA ČR - Czech Science Foundation (CSF) Institutional support UPT-D - RVO:68081731 Annotation We built a custom ultra-high vacuum scanning low energy electron microscope. It allows us to measure transmitted electron spectra using the time-of-flight (TOF) method. The cathode-lens
principle, applying voltage bias to the sample (stage), allows us to measure at different landing energies ranging from 5 keV down to few eV. The setting of the voltages on active components can be optimised with respect to different quantities, e.g. length of the TOF spectra in the time-domain, keeping detected momentum transfer comparable across different landing energies etc. We reconstruct the hyper-spectral data, TOF spectrum for each pixel in each scan of selected frames, from the collected primary data - a set of timestamps. Single TOF spectrum is obtained by selecting the region of interest, pixels corresponding to the best quality of the sample, and simply adding up the spectra from all the selected pixels. We present the methodology of the data processing and results obtained for a commercial single-layer graphene sample from the Ted Pella company. The experimental data were complemented by the density-functional theory and the many-body perturbation theory simulations and they corroborate our measurements and data processing methods. We use the experimental data to estimate inelastic mean free path (IMFP) using the log-ratio method to sample the energy-profile of the IMFP within the regime of low landing energies. The resulting effective IMFP values for a single-layer graphene are in good agreement with existing literature. We plan to study other 2D and thin materials of scientific and commercial interest as well.Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2023 Electronic address https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Number of the records: 1