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Effective IMFP of thin samples via the time-of-flight method

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    SYSNO ASEP0567527
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    TitleEffective IMFP of thin samples via the time-of-flight method
    Author(s) Zouhar, Martin (UPT-D) ORCID, RID, SAI
    Daniel, Benjamin (UPT-D) RID
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Paták, Aleš (UPT-D) RID, ORCID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Source Title16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. - Brno : Czechoslovak Microscopy Society, 2022 / Krzyžánek V. ; Hrubanová K. ; Hozák P. ; Müllerová I. ; Šlouf M. - ISBN 978-80-11-02253-2
    S. 168
    Number of pages1 s.
    Publication formOnline - E
    ActionMultinational Congress on Microscopy /16./
    Event date04.09.2022 - 09.09.2022
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordstime‑of‑flight spectrometer ; SLEEM ; inelastic mean free path
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryElectrical and electronic engineering
    R&D ProjectsGA22-34286S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUPT-D - RVO:68081731
    AnnotationWe built a custom ultra-high vacuum scanning low energy electron microscope. It allows us to measure transmitted electron spectra using the time-of-flight (TOF) method. The cathode-lens
    principle, applying voltage bias to the sample (stage), allows us to measure at different landing energies ranging from 5 keV down to few eV. The setting of the voltages on active components can be optimised with respect to different quantities, e.g. length of the TOF spectra in the time-domain, keeping detected momentum transfer comparable across different landing energies etc. We reconstruct the hyper-spectral data, TOF spectrum for each pixel in each scan of selected frames, from the collected primary data - a set of timestamps. Single TOF spectrum is obtained by selecting the region of interest, pixels corresponding to the best quality of the sample, and simply adding up the spectra from all the selected pixels. We present the methodology of the data processing and results obtained for a commercial single-layer graphene sample from the Ted Pella company. The experimental data were complemented by the density-functional theory and the many-body perturbation theory simulations and they corroborate our measurements and data processing methods. We use the experimental data to estimate inelastic mean free path (IMFP) using the log-ratio method to sample the energy-profile of the IMFP within the regime of low landing energies. The resulting effective IMFP values for a single-layer graphene are in good agreement with existing literature. We plan to study other 2D and thin materials of scientific and commercial interest as well.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2023
    Electronic addresshttps://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Number of the records: 1  

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