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Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar.sup.+./sup. ion beam
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SYSNO 0556898 Title Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar+ ion beam Author(s) Vacík, Jiří (UJF-V) [ONF] RID, ORCID, SAI
Cannavó, Antonino (UJF-V) [ONF] ORCID, SAI
Bakardjieva, Snejana (UACH-T) [CIT] SAI, RID, ORCID
Kupčík, Jaroslav (UACH-T) [CIT] SAI, RID, ORCID
Lavrentiev, Vasyl (UJF-V) [ONF] RID, ORCID, SAI
Ceccio, Giovanni (UJF-V) [ONF] ORCID, RID, SAI
Horák, Pavel (UJF-V) [ONF] RID, ORCID
Němeček, J. (CZ)
Verna, A. (IT)
Parmeggiani, M. (IT)
Calcagno, L. (IT)
Klie, R. (US)
Duchon, J. (CZ)Source Title Radiation Effects and Defects in Solids. Roč. 177, 1-2 (2022), s. 137-160. - : Taylor & Francis Document Type Článek v odborném periodiku Grant EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA18-21677S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic Institutional support UJF-V - RVO:61389005 ; UACH-T - RVO:61388980 Language eng Country GB Keywords ion beam synthesis * Hf-In-C nanocomposite * Hf2InC MAX phase * HfC0 * (95) phase * radiation tolerance Cooperating institutions České vysoké učení technické v Praze, Fakulta strojní (Czech Republic) URL https://doi.org/10.1080/10420150.2022.2049788 Permanent Link http://hdl.handle.net/11104/0331530
Number of the records: 1