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Transferless Inverted graphene/silicon heterostructures prepared by plasma-enhanced chemical vapor deposition of amorphous silicon on CVD graphene

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    SYSNO ASEP0531897
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleTransferless Inverted graphene/silicon heterostructures prepared by plasma-enhanced chemical vapor deposition of amorphous silicon on CVD graphene
    Author(s) Müller, Martin (FZU-D) RID, ORCID
    Bouša, Milan (UFCH-W) RID, ORCID
    Hájková, Zdeňka (FZU-D) RID, ORCID
    Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Fejfar, Antonín (FZU-D) RID, ORCID, SAI
    Drogowska-Horna, Karolina A. (UFCH-W)
    Kalbáč, Martin (UFCH-W) RID, ORCID
    Frank, Otakar (UFCH-W) RID, ORCID
    Number of authors8
    Article number589
    Source TitleNanomaterials. - : MDPI
    Roč. 10, č. 3 (2020), s. 1-10
    Number of pages10 s.
    Languageeng - English
    CountryCH - Switzerland
    Keywordssilicon ; graphene ; heterostructure ; CDV
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    Subject RIV - cooperationJ. Heyrovsky Institute of Physical Chemistry - Physical ; Theoretical Chemistry
    R&D ProjectsEF16_026/0008382 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA17-18702S GA ČR - Czech Science Foundation (CSF)
    EF16_013/0001821 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Method of publishingOpen access
    Institutional supportFZU-D - RVO:68378271 ; UFCH-W - RVO:61388955
    UT WOS000526090400189
    EID SCOPUS85082713590
    DOI10.3390/nano10030589
    AnnotationThe heterostructures of two-dimensional (2D) and three-dimensional (3D) materials represent one of the focal points of current nanotechnology research and development. From an application perspective, the possibility of a direct integration of active 2D layers with exceptional optoelectronic and mechanical properties into the existing semiconductor manufacturing processes is extremely appealing. However, for this purpose, 2D materials should ideally be grown directly on 3D substrates to avoid the transferring step, which induces damage and contamination of the 2D layer. Alternatively, when such an approach is difficult-as is the case of graphene on noncatalytic substrates such as Si-inverted structures can be created, where the 3D material is deposited onto the 2D substrate. In the present work, we investigated the possibility of using plasma-enhanced chemical vapor deposition (PECVD) to deposit amorphous hydrogenated Si (a-Si:H) onto graphene resting on a catalytic copper foil. The resulting stacks created at different Si deposition temperatures were investigated by the combination of Raman spectroscopy (to quantify the damage and to estimate the change in resistivity of graphene), temperature-dependent dark conductivity, and constant photocurrent measurements (to monitor the changes in the electronic properties of a-Si:H). The results indicate that the optimum is 100 degrees C deposition temperature, where the graphene still retains most of its properties and the a-Si:H layer presents high-quality, device-ready characteristics.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2021
    Electronic addresshttp://hdl.handle.net/11104/0310529
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