Number of the records: 1
Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging
- 1.Skoupý, Radim - Krzyžánek, Vladislav
Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 74-76. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
OECD category: Nano-materials (production and properties)
http://hdl.handle.net/11104/0287632
Number of the records: 1