GaN quantum dot polarity determination by X-ray photoelectron diffraction

Number of the records: 1

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SYSNO	0463238
Title	GaN quantum dot polarity determination by X-ray photoelectron diffraction
Author(s)	Romanyuk, Olexandr (FZU-D)_{RID, ORCID} Bartoš, Igor (FZU-D)_{RID, ORCID} Brault, J. (FR) De Mierry, P. (FR) Paskova, T. (US) Jiříček, Petr (FZU-D)_{RID, ORCID, SAI}
Source Title	Applied Surface Science. Roč. 389, Dec (2016), s. 1156-1160. - : Elsevier
Document Type	Článek v odborném periodiku
Grant	GA15-01687S GA ČR - Czech Science Foundation (CSF)
	LM2015088 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	FZU-D - RVO:68378271
Language	eng
Country	NL
Keywords	GaN * semipolar GaN * quantum dots * X-ray photoelectron diffraction * surface polarity
Permanent Link	http://hdl.handle.net/11104/0262652

Number of the records: 1